American Testing Services would like to thank the Department of the Air Force for inviting Chris Small to speak during the 60th Defense Working Group on Nondestructive Testing Conference held last month in Saint Augustine, Florida. The invitation to present followed a successful completion of Phase I testing and Phase II award through the Small Business Innovative Research (SBIR) program.
Chris presented a lecture on the technical paper Laser Generated Defects for Multi-Purpose Probability of Detection (POD) Test Kits. Defect samples are needed in NDT as calibration references and as practical test pieces for initial qualification and annual review of NDT technicians. Research taking place at ATS looks to modernize the way defect samples are made utilizing laser technology to increase availability and flexibility while lowering cost to the consumer.